d4eb3443991bc36a1c40 · Key nonlinear measurement events

{
  "title_en": "Key nonlinear measurement events",
  "designation": "",
  "series": "",
  "status": "",
  "date": "2007-08-01",
  "date_original": "August 1, 2007",
  "url": "https://www.nist.gov/publications/key-nonlinear-measurement-events",
  "source": "NIST Publications",
  "display_en": "",
  "authors_en": "Catherine A. Remley , Dominique Schreurs",
  "abstract_excerpt_en": "In this article, we describe two engineer-friendly events - the Automatic RF Techniques Group (ARFTG) Nonlinear Measurements Workshop and the Nonlinear Vector Network Analyzer (NVNA) Users' Forum - designed to let participants learn about and discuss",
  "id": "d4eb3443991bc36a1c40",
  "sources": [
    "NIST Publications"
  ],
  "source_records": [
    {
      "title_en": "Key nonlinear measurement events",
      "designation": "",
      "series": "",
      "status": "",
      "date": "2007-08-01",
      "date_original": "August 1, 2007",
      "url": "https://www.nist.gov/publications/key-nonlinear-measurement-events",
      "source": "NIST Publications",
      "display_en": "",
      "authors_en": "Catherine A. Remley , Dominique Schreurs",
      "abstract_excerpt_en": "In this article, we describe two engineer-friendly events - the Automatic RF Techniques Group (ARFTG) Nonlinear Measurements Workshop and the Nonlinear Vector Network Analyzer (NVNA) Users' Forum - designed to let participants learn about and discuss"
    }
  ],
  "translation_state": "none"
}