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d6f046e8b29c7ab3db2e · Evaluation of Dual-Port Circularly Polarized Probes for Planar Near-Field Measurements

Evaluation of Dual-Port Circularly Polarized Probes for Planar Near-Field Measurements

Официальный источник · 1990-10-01

Полные импортированные сведения карточки
{
  "title_en": "Evaluation of Dual-Port Circularly Polarized Probes for Planar Near-Field Measurements",
  "designation": "",
  "series": "",
  "status": "",
  "date": "1990-10-01",
  "date_original": "October 1, 1990",
  "url": "https://www.nist.gov/publications/evaluation-dual-port-circularly-polarized-probes-planar-near-field-measurements",
  "source": "NIST Publications",
  "display_en": "",
  "authors_en": "Michael H. Francis , Katherine MacReynolds",
  "abstract_excerpt_en": "",
  "id": "d6f046e8b29c7ab3db2e",
  "sources": [
    "NIST Publications"
  ],
  "source_records": [
    {
      "title_en": "Evaluation of Dual-Port Circularly Polarized Probes for Planar Near-Field Measurements",
      "designation": "",
      "series": "",
      "status": "",
      "date": "1990-10-01",
      "date_original": "October 1, 1990",
      "url": "https://www.nist.gov/publications/evaluation-dual-port-circularly-polarized-probes-planar-near-field-measurements",
      "source": "NIST Publications",
      "display_en": "",
      "authors_en": "Michael H. Francis , Katherine MacReynolds",
      "abstract_excerpt_en": ""
    }
  ],
  "translation_state": "none"
}