NIST · ИТ · df18872bc9999f983a49
An Empirical Comparison of Combinatorial and Random Testing
Some conflicting results have been reported on the comparison between t-way combinatorial testing and random testing. In this paper, we report a new study that applies t-way and random testing to the Siemens suite. In particular, we investigate the
NIST · ИТОфициальный источник · 2014-04-01
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"title_en": "An Empirical Comparison of Combinatorial and Random Testing",
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"date": "2014-04-01",
"date_original": "April 1, 2014",
"url": "https://www.nist.gov/publications/empirical-comparison-combinatorial-and-random-testing-0",
"source": "NIST Publications",
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"authors_en": "Laleh Ghandehari, Jacek Czerwonka, Yu Lei, Soheil Shafiee, Raghu N. Kacker , D. Richard Kuhn",
"abstract_excerpt_en": "Some conflicting results have been reported on the comparison between t-way combinatorial testing and random testing. In this paper, we report a new study that applies t-way and random testing to the Siemens suite. In particular, we investigate the",
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"title_en": "An Empirical Comparison of Combinatorial and Random Testing",
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"url": "https://www.nist.gov/publications/empirical-comparison-combinatorial-and-random-testing-0",
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"authors_en": "Laleh Ghandehari, Jacek Czerwonka, Yu Lei, Soheil Shafiee, Raghu N. Kacker , D. Richard Kuhn",
"abstract_excerpt_en": "Some conflicting results have been reported on the comparison between t-way combinatorial testing and random testing. In this paper, we report a new study that applies t-way and random testing to the Siemens suite. In particular, we investigate the"
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