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e2ce868db897bb023856 · High Current Sic JBS Diode Characterization for Hard- and Soft-switching Applications

High Current Sic JBS Diode Characterization for Hard- and Soft-switching Applications

Официальный источник · 2001-10-01

Полные импортированные сведения карточки
{
  "title_en": "High Current Sic JBS Diode Characterization for Hard- and Soft-switching Applications",
  "designation": "",
  "series": "",
  "status": "",
  "date": "2001-10-01",
  "date_original": "October 1, 2001",
  "url": "https://www.nist.gov/publications/high-current-sic-jbs-diode-characterization-hard-and-soft-switching-applications",
  "source": "NIST Publications",
  "display_en": "",
  "authors_en": "Jih-Sheng Lai, X Huang, H. Yu, Allen R. Hefner Jr. , David W. Berning , Ranbir Singh",
  "abstract_excerpt_en": "",
  "id": "e2ce868db897bb023856",
  "sources": [
    "NIST Publications"
  ],
  "source_records": [
    {
      "title_en": "High Current Sic JBS Diode Characterization for Hard- and Soft-switching Applications",
      "designation": "",
      "series": "",
      "status": "",
      "date": "2001-10-01",
      "date_original": "October 1, 2001",
      "url": "https://www.nist.gov/publications/high-current-sic-jbs-diode-characterization-hard-and-soft-switching-applications",
      "source": "NIST Publications",
      "display_en": "",
      "authors_en": "Jih-Sheng Lai, X Huang, H. Yu, Allen R. Hefner Jr. , David W. Berning , Ranbir Singh",
      "abstract_excerpt_en": ""
    }
  ],
  "translation_state": "none"
}