NIST · ИТ · eaa6ebaf5ac1debf5fd9
SIM.EM-S5 Voltage, Current and Resistance Comparison
This paper reports the results of the second Interamerican Metrology System (SIM) comparison on calibration of digital multimeters, performed for strengthening the interaction among National Metrology Institutes (NMIs) and for establishing the degree of
NIST · ИТОфициальный источник · 2012-06-01
{
"title_en": "SIM.EM-S5 Voltage, Current and Resistance Comparison",
"designation": "",
"series": "",
"status": "",
"date": "2012-06-01",
"date_original": "June 1, 2012",
"url": "https://www.nist.gov/publications/simem-s5-voltage-current-and-resistance-comparison",
"source": "NIST Publications",
"display_en": "",
"authors_en": "Harold Sanchez, Lucas Di Lillo, Gregory Kyriazis, Rodrigo Ramos, Randolph Elmquist , Nien F. Zhang",
"abstract_excerpt_en": "This paper reports the results of the second Interamerican Metrology System (SIM) comparison on calibration of digital multimeters, performed for strengthening the interaction among National Metrology Institutes (NMIs) and for establishing the degree of",
"id": "eaa6ebaf5ac1debf5fd9",
"sources": [
"NIST Publications"
],
"source_records": [
{
"title_en": "SIM.EM-S5 Voltage, Current and Resistance Comparison",
"designation": "",
"series": "",
"status": "",
"date": "2012-06-01",
"date_original": "June 1, 2012",
"url": "https://www.nist.gov/publications/simem-s5-voltage-current-and-resistance-comparison",
"source": "NIST Publications",
"display_en": "",
"authors_en": "Harold Sanchez, Lucas Di Lillo, Gregory Kyriazis, Rodrigo Ramos, Randolph Elmquist , Nien F. Zhang",
"abstract_excerpt_en": "This paper reports the results of the second Interamerican Metrology System (SIM) comparison on calibration of digital multimeters, performed for strengthening the interaction among National Metrology Institutes (NMIs) and for establishing the degree of"
}
],
"translation_state": "none"
}