NIST · ИТ · ed48801189e636cdc6ff
On-Wafer Measurement of Transistor Noise Parameters at NIST
NIST has developed the capability to measure noise parameters on a wafer int he 1-12.4 GHz range. We describe the measurement method and the uncertainty analysis and present results of measurements on a very poorly matched transistor.
NIST · ИТОфициальный источник · 2007-04-01
{
"title_en": "On-Wafer Measurement of Transistor Noise Parameters at NIST",
"designation": "",
"series": "",
"status": "",
"date": "2007-04-01",
"date_original": "April 1, 2007",
"url": "https://www.nist.gov/publications/wafer-measurement-transistor-noise-parameters-nist",
"source": "NIST Publications",
"display_en": "",
"authors_en": "James P. Randa , Dave K. Walker",
"abstract_excerpt_en": "NIST has developed the capability to measure noise parameters on a wafer int he 1-12.4 GHz range. We describe the measurement method and the uncertainty analysis and present results of measurements on a very poorly matched transistor.",
"id": "ed48801189e636cdc6ff",
"sources": [
"NIST Publications"
],
"source_records": [
{
"title_en": "On-Wafer Measurement of Transistor Noise Parameters at NIST",
"designation": "",
"series": "",
"status": "",
"date": "2007-04-01",
"date_original": "April 1, 2007",
"url": "https://www.nist.gov/publications/wafer-measurement-transistor-noise-parameters-nist",
"source": "NIST Publications",
"display_en": "",
"authors_en": "James P. Randa , Dave K. Walker",
"abstract_excerpt_en": "NIST has developed the capability to measure noise parameters on a wafer int he 1-12.4 GHz range. We describe the measurement method and the uncertainty analysis and present results of measurements on a very poorly matched transistor."
}
],
"translation_state": "none"
}