NIST · ИТ · f009344aff7ebe3810f8
Characterization of Normally-off SiC Vertical JFET Devices and Inverter Circuits
A normally-off SiC JFETs has been characterized under static and dynamic operating conditions. Two application oriented inverter circuits were constructed for additional tests under soft- and hard-switching conditions. The single-phase soft-switching
NIST · ИТОфициальный источник · 2005-10-01
{
"title_en": "Characterization of Normally-off SiC Vertical JFET Devices and Inverter Circuits",
"designation": "",
"series": "",
"status": "",
"date": "2005-10-01",
"date_original": "October 1, 2005",
"url": "https://www.nist.gov/publications/characterization-normally-sic-vertical-jfet-devices-and-inverter-circuits",
"source": "NIST Publications",
"display_en": "",
"authors_en": "Jih-Sheng Lai, H. Yu, J. Zhang, Y. Li, Kuang Sheng, J.H. Zhao, Allen R. Hefner Jr.",
"abstract_excerpt_en": "A normally-off SiC JFETs has been characterized under static and dynamic operating conditions. Two application oriented inverter circuits were constructed for additional tests under soft- and hard-switching conditions. The single-phase soft-switching",
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"NIST Publications"
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"source_records": [
{
"title_en": "Characterization of Normally-off SiC Vertical JFET Devices and Inverter Circuits",
"designation": "",
"series": "",
"status": "",
"date": "2005-10-01",
"date_original": "October 1, 2005",
"url": "https://www.nist.gov/publications/characterization-normally-sic-vertical-jfet-devices-and-inverter-circuits",
"source": "NIST Publications",
"display_en": "",
"authors_en": "Jih-Sheng Lai, H. Yu, J. Zhang, Y. Li, Kuang Sheng, J.H. Zhao, Allen R. Hefner Jr.",
"abstract_excerpt_en": "A normally-off SiC JFETs has been characterized under static and dynamic operating conditions. Two application oriented inverter circuits were constructed for additional tests under soft- and hard-switching conditions. The single-phase soft-switching"
}
],
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}