NIST · ИТ · f1823114f85a18defd99
Uncertainty Analysis for Noise-Parameter Measurements
A brief summary is presented for the uncertainty analysis for measurements of noise parameters of amplifiers and transistors, in both connectorized (coaxial) and on-wafer environments. We treat both the X-parameters, which are based on the wave
NIST · ИТОфициальный источник · 2008-06-08
{
"title_en": "Uncertainty Analysis for Noise-Parameter Measurements",
"designation": "",
"series": "",
"status": "",
"date": "2008-06-08",
"date_original": "June 8, 2008",
"url": "https://www.nist.gov/publications/uncertainty-analysis-noise-parameter-measurements",
"source": "NIST Publications",
"display_en": "",
"authors_en": "James P. Randa",
"abstract_excerpt_en": "A brief summary is presented for the uncertainty analysis for measurements of noise parameters of amplifiers and transistors, in both connectorized (coaxial) and on-wafer environments. We treat both the X-parameters, which are based on the wave",
"id": "f1823114f85a18defd99",
"sources": [
"NIST Publications"
],
"source_records": [
{
"title_en": "Uncertainty Analysis for Noise-Parameter Measurements",
"designation": "",
"series": "",
"status": "",
"date": "2008-06-08",
"date_original": "June 8, 2008",
"url": "https://www.nist.gov/publications/uncertainty-analysis-noise-parameter-measurements",
"source": "NIST Publications",
"display_en": "",
"authors_en": "James P. Randa",
"abstract_excerpt_en": "A brief summary is presented for the uncertainty analysis for measurements of noise parameters of amplifiers and transistors, in both connectorized (coaxial) and on-wafer environments. We treat both the X-parameters, which are based on the wave"
}
],
"translation_state": "none"
}