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f6a8b3e2daf576cb10a5 · New reference standards and artifacts for nanoscale physical property characterization

New reference standards and artifacts for nanoscale physical property characterization

This paper provides an overview of calibration artifacts being developed at the National Institute of Standards and Technology (NIST) that are intended to aid the accurate determination of nanoscale physical properties across a broad range of applications

Официальный источник · 2006-07-01

Полные импортированные сведения карточки
{
  "title_en": "New reference standards and artifacts for nanoscale physical property characterization",
  "designation": "",
  "series": "",
  "status": "",
  "date": "2006-07-01",
  "date_original": "July 1, 2006",
  "url": "https://www.nist.gov/publications/new-reference-standards-and-artifacts-nanoscale-physical-property-characterization",
  "source": "NIST Publications",
  "display_en": "",
  "authors_en": "Jon R. Pratt , John A. Kramar , Gordon Shaw, Richard Gates, Paul Rice , John M. Moreland",
  "abstract_excerpt_en": "This paper provides an overview of calibration artifacts being developed at the National Institute of Standards and Technology (NIST) that are intended to aid the accurate determination of nanoscale physical properties across a broad range of applications",
  "id": "f6a8b3e2daf576cb10a5",
  "sources": [
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  "source_records": [
    {
      "title_en": "New reference standards and artifacts for nanoscale physical property characterization",
      "designation": "",
      "series": "",
      "status": "",
      "date": "2006-07-01",
      "date_original": "July 1, 2006",
      "url": "https://www.nist.gov/publications/new-reference-standards-and-artifacts-nanoscale-physical-property-characterization",
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      "authors_en": "Jon R. Pratt , John A. Kramar , Gordon Shaw, Richard Gates, Paul Rice , John M. Moreland",
      "abstract_excerpt_en": "This paper provides an overview of calibration artifacts being developed at the National Institute of Standards and Technology (NIST) that are intended to aid the accurate determination of nanoscale physical properties across a broad range of applications"
    }
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  "translation_state": "none"
}