NIST · ИТ · f7c2e9a94fce64b09055
Characterization and Applications of On-Wafer Diode Noise Sources
A set of wafer-probeable diode noise source transfer standards are characterized using on-wafer noise-temperature methods developed at the National Institute of Standards and Technology (NIST), Boulder, CO.
NIST · ИТОфициальный источник · 1998-12-01
{
"title_en": "Characterization and Applications of On-Wafer Diode Noise Sources",
"designation": "",
"series": "",
"status": "",
"date": "1998-12-01",
"date_original": "December 1, 1998",
"url": "https://www.nist.gov/publications/characterization-and-applications-wafer-diode-noise-sources",
"source": "NIST Publications",
"display_en": "",
"authors_en": "Lawrence P. Dunleavy, James P. Randa , Dave K. Walker , Robert L. Billinger , John Rice",
"abstract_excerpt_en": "A set of wafer-probeable diode noise source transfer standards are characterized using on-wafer noise-temperature methods developed at the National Institute of Standards and Technology (NIST), Boulder, CO.",
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{
"title_en": "Characterization and Applications of On-Wafer Diode Noise Sources",
"designation": "",
"series": "",
"status": "",
"date": "1998-12-01",
"date_original": "December 1, 1998",
"url": "https://www.nist.gov/publications/characterization-and-applications-wafer-diode-noise-sources",
"source": "NIST Publications",
"display_en": "",
"authors_en": "Lawrence P. Dunleavy, James P. Randa , Dave K. Walker , Robert L. Billinger , John Rice",
"abstract_excerpt_en": "A set of wafer-probeable diode noise source transfer standards are characterized using on-wafer noise-temperature methods developed at the National Institute of Standards and Technology (NIST), Boulder, CO."
}
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