NIST · ИТ · f9c35425fd203b3ec4c9
Characterization of On-Wafer Diode Noise Sources
A set of wafer probeable diode noise source transfer standards are characterized using on-wafer noise temperature methods developed recently at the National Institute of Standards and Technology (NIST). This paper reviews the methods for accurate on-wafer
NIST · ИТОфициальный источник · 1998-06-01
{
"title_en": "Characterization of On-Wafer Diode Noise Sources",
"designation": "",
"series": "",
"status": "",
"date": "1998-06-01",
"date_original": "June 1, 1998",
"url": "https://www.nist.gov/publications/characterization-wafer-diode-noise-sources",
"source": "NIST Publications",
"display_en": "",
"authors_en": "James P. Randa , Dave K. Walker , Lawrence P. Dunleavy, Robert L. Billinger , John Rice",
"abstract_excerpt_en": "A set of wafer probeable diode noise source transfer standards are characterized using on-wafer noise temperature methods developed recently at the National Institute of Standards and Technology (NIST). This paper reviews the methods for accurate on-wafer",
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{
"title_en": "Characterization of On-Wafer Diode Noise Sources",
"designation": "",
"series": "",
"status": "",
"date": "1998-06-01",
"date_original": "June 1, 1998",
"url": "https://www.nist.gov/publications/characterization-wafer-diode-noise-sources",
"source": "NIST Publications",
"display_en": "",
"authors_en": "James P. Randa , Dave K. Walker , Lawrence P. Dunleavy, Robert L. Billinger , John Rice",
"abstract_excerpt_en": "A set of wafer probeable diode noise source transfer standards are characterized using on-wafer noise temperature methods developed recently at the National Institute of Standards and Technology (NIST). This paper reviews the methods for accurate on-wafer"
}
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