fda9c297ef9d3ddfe7ec · Traceable Characterization of Broadband Pulse Waveforms Suitable for Cryogenic Josephson Voltage Applications
Traceable Characterization of Broadband Pulse Waveforms Suitable for Cryogenic Josephson Voltage Applications
We characterize broadband pulse waveforms using a large signal network analyzer (LSNA) and a sampling-oscilloscope, both calibrated to the same reference plane and traceable to the NIST Electro-Optic Sampling System (EOS). The waveforms under test are
{
"title_en": "Traceable Characterization of Broadband Pulse Waveforms Suitable for Cryogenic Josephson Voltage Applications",
"designation": "",
"series": "",
"status": "",
"date": "2018-08-20",
"date_original": "August 20, 2018",
"url": "https://www.nist.gov/publications/traceable-characterization-broadband-pulse-waveforms-suitable-cryogenic-josephson",
"source": "NIST Publications",
"display_en": "",
"authors_en": "Alirio De Jesus Soares Boaventura , Dylan F. Williams , Gustavo Avolio, Paul D. Hale",
"abstract_excerpt_en": "We characterize broadband pulse waveforms using a large signal network analyzer (LSNA) and a sampling-oscilloscope, both calibrated to the same reference plane and traceable to the NIST Electro-Optic Sampling System (EOS). The waveforms under test are",
"id": "fda9c297ef9d3ddfe7ec",
"sources": [
"NIST Publications"
],
"source_records": [
{
"title_en": "Traceable Characterization of Broadband Pulse Waveforms Suitable for Cryogenic Josephson Voltage Applications",
"designation": "",
"series": "",
"status": "",
"date": "2018-08-20",
"date_original": "August 20, 2018",
"url": "https://www.nist.gov/publications/traceable-characterization-broadband-pulse-waveforms-suitable-cryogenic-josephson",
"source": "NIST Publications",
"display_en": "",
"authors_en": "Alirio De Jesus Soares Boaventura , Dylan F. Williams , Gustavo Avolio, Paul D. Hale",
"abstract_excerpt_en": "We characterize broadband pulse waveforms using a large signal network analyzer (LSNA) and a sampling-oscilloscope, both calibrated to the same reference plane and traceable to the NIST Electro-Optic Sampling System (EOS). The waveforms under test are"
}
],
"translation_state": "none"
}