NIST · ИТ · fffe41b61376316cf683
Reverse Noise Measurement and Use in Device Characterization
We review the concept of reverse noise measurements in the context of on-wafer transistor noise characterization. Several different applications of reverse noise measurements are suggested and demonstrated. Reverse measurements can be used to check
NIST · ИТОфициальный источник · 2006-06-10
{
"title_en": "Reverse Noise Measurement and Use in Device Characterization",
"designation": "",
"series": "",
"status": "",
"date": "2006-06-10",
"date_original": "June 10, 2006",
"url": "https://www.nist.gov/publications/reverse-noise-measurement-and-use-device-characterization",
"source": "NIST Publications",
"display_en": "",
"authors_en": "James P. Randa , Tom McKay, Susan L. Sweeney, Dave K. Walker , Lawrence Wagner, David R. Greenberg, Jon Tao, G. Ali Rezvani",
"abstract_excerpt_en": "We review the concept of reverse noise measurements in the context of on-wafer transistor noise characterization. Several different applications of reverse noise measurements are suggested and demonstrated. Reverse measurements can be used to check",
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{
"title_en": "Reverse Noise Measurement and Use in Device Characterization",
"designation": "",
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"date": "2006-06-10",
"date_original": "June 10, 2006",
"url": "https://www.nist.gov/publications/reverse-noise-measurement-and-use-device-characterization",
"source": "NIST Publications",
"display_en": "",
"authors_en": "James P. Randa , Tom McKay, Susan L. Sweeney, Dave K. Walker , Lawrence Wagner, David R. Greenberg, Jon Tao, G. Ali Rezvani",
"abstract_excerpt_en": "We review the concept of reverse noise measurements in the context of on-wafer transistor noise characterization. Several different applications of reverse noise measurements are suggested and demonstrated. Reverse measurements can be used to check"
}
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