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Anomalies Observed in Wafer Level Microwave Testing

Anomalies Observed in Wafer Level Microwave Testing

Two anomalies have been observed in the course of developing planar wafer level standards for the testing of GaAs monolithic microwave integrated circuits. The first involves a low-frequency characteristic impedance change of microstrip and coplanar

ITL Bulletin

Security Issues in the Use of Electronic Data Interchange

IR 4614

Standard Security Label for GOSIP: an Invitational Workshop

NIST Support for the Computer-Aided Acquisition and Logistic Support (CALS) Program in the Area of Graphics Standards, Calendar Year 1990

NIST Support for the Computer-Aided Acquisition and Logistic Support (CALS) Program in the Area of Graphics Standards, Calendar Year 1990

Applicaton Portability Profile (APP) The U.S. Government's Open System Environment Profile OSE/1 Version 1.0

Applicaton Portability Profile (APP) The U.S. Government's Open System Environment Profile OSE/1 Version 1.0

An Open System Environment (OSE) encompasses the functionality needed to provide interoperability, portability, and scalability of computerized applications across networks of heterogeneous hardware/software platforms. The OSE forms an extensible framework

Public-Key Cryptography

Public-Key Cryptography

This publication presents a state-of-the-art survey of public-key cryptography, circa 1988-1990, and covers the following topics: 1) the theory of public-key cryptography; 2) comparisons to conventional (secret-key) cryptography; 3) a largely self

Issues in TranNISTSParent File Access

Issues in TranNISTSParent File Access

Computer Security: Selected Articles

Computer Security: Selected Articles

This National Institute of Standards and Technology Internal Report (NISTIR) presents nine articles which represent a wide spectrum of computer security information. The articles were selected by the staff of the Computer Security Division, Computer

SP 800-2

Public Key Cryptography

ITL Bulletin

FIPS 140: A Standard in Transition

IR 4545

Computer Security: Selected Articles

Magnetic field dependence of the critical current anisotropy in normal metal-YBa,Cu307-delta thin-film bilayers

Magnetic field dependence of the critical current anisotropy in normal metal-YBa,Cu307-delta thin-film bilayers

We have measured the transport critical current density (Jc) in epitaxial quality films of YBa2Cuj07-delta some of which were covered by thin (10 nm) Ag films. The films, both with and without Ag, had Jc values greater than 10^6 A/cm2 in liquid nitrogen

IR 4518

National Aeronautics and Space Administration's (NASA) Automated Information Security Handbook

Raster Graphics Conformance Testing

Raster Graphics Conformance Testing

ITL Bulletin

Computer Security Roles of NIST and NSA

Measurements on the NIST GEC Reference Cell

Measurements on the NIST GEC Reference Cell