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Выбранные официальные каталоги по ИТ, безопасности, приватности, ИИ и связи.

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Use of the Oscillation Based Built-in Self-test Method for Smart Sensor Devices

Use of the Oscillation Based Built-in Self-test Method for Smart Sensor Devices

An oscillation-based built in self-test (BIST) method is presented for functional testing of mixed signal devices. An integral component of this method of on-chip testing involves transforming an oscillating analog signal into a digital clock-like signal

Electron Transport, Ionization, and Attachment Coefficients in C 2 F 4 and C 2 F 4 /Ar Mixtures

Electron Transport, Ionization, and Attachment Coefficients in C 2 F 4 and C 2 F 4 /Ar Mixtures

This is a summary report of the paper to be published in the Journal of Chemical Physics. Measurements of electron transport, effective ionization, and attachment coefficients are reported for C 2F 4. In addition, measurements of the electron drift

ITL Bulletin

Biometrics - Technologies for Highly Secure Personal Authentication

Stability Measurements on Noise Sources

Stability Measurements on Noise Sources

PBX Vulnerability Analysis: Finding Holes in Your PBX Before Someone Else Does

PBX Vulnerability Analysis: Finding Holes in Your PBX Before Someone Else Does

This report presents a generic methodology for conducting an analysis of a Private Branch Exchange (PBX) in order to identify security vulnerabilities. The report focuses on digital-based PBXs and addresses the following areas for study: System

A High-Speed Thermal Imaging System for Semiconductor Device Analysis

A High-Speed Thermal Imaging System for Semiconductor Device Analysis

A new high-speed transient thermal imaging system is presented that provides the capability to measure the transient temperature distributions on the surface of a silicon chip with 1 υs time, and 15 υm spatial resolution. The system uses virtual instrument

SP 800-24

PBX Vulnerability Analysis: Finding Holes in Your PBX Before Someone Else Does

IGBT Model Validation for Soft-Switching Applications

IGBT Model Validation for Soft-Switching Applications

Techniques are described for validating the performance of Insulated-Gate Bipolar Transistor (IGBT) circuit simulator models for soft-switching circuit conditions. The circuits used for the validation include a soft-switched boost converter similar to that

An Introduction to IPsec (Internet Protocol Security)

An Introduction to IPsec (Internet Protocol Security)

IPsec (Internet Protocol Security) is an attempt to utilize cryptographic techniques in a global solution to the problem of Internet security. Rather than requiring each email program or Web browser to implement its own security mechanisms, IPsec involves

ITL Bulletin

An Introduction to IPsec (Internet Protocol Security)

SiC Power Diodes Provide Breakthrough Performance for a Wide Range of Applications

SiC Power Diodes Provide Breakthrough Performance for a Wide Range of Applications

The electrical performance of Silicon Carbide (SiC) diodes are evaluated and compared to commercially available Silicon (Si) diodes in the voltage range from 600 V through 5000 V. The comparisons include the on-state characteristics, the reverse recovery

The Importance of Focused Evaluations: A Case Study of TREC and DUC

The Importance of Focused Evaluations: A Case Study of TREC and DUC

Evaluation has always been an important part of scientific research, and in information retrieval, this evaluation has mostly been done using test collections. In 1992, a new test collection was built at the National Institute of Standards and Technology

Distribution of Link Distances in a Wireless Network

Distribution of Link Distances in a Wireless Network

The probability distribution is found for the link distance between two randomly positioned mobile radios for two representative deployment scenarios: (1) the mobile locations are uniformly distributed over a rectangular area and (2) the x and y

Introduction to Public Key Technology and the Federal PKI Infrastructure

Introduction to Public Key Technology and the Federal PKI Infrastructure

This publication was developed to assist agency decision-makers in determining if a PKI is appropriate for their agency, and how PKI services can be deployed most effectively within a Federal agency. It is intended to provide an overview of PKI functions

SP 800-32

Introduction to Public Key Technology and the Federal PKI Infrastructure

Measuring Antennas Above 1 GHz

Measuring Antennas Above 1 GHz

The techniques for EMC measurements used with antennas above 1 GHz have been gleaned from methods used at lower frequencies. The assumptions made in applying these techniques have not been completely validated. This analysis will compare antennas for use

Information Technology Measurement and Testing Activities at NIST

Information Technology Measurement and Testing Activities at NIST

Our high technology society continues to rely more and more upon sophisticated measurements, technical standards, and associated testing activities. This was true for the industrial society of the 20th century and remains true for the information society

Exploring Site Quality Above 1 GHz Using Double Ridged Horns

Exploring Site Quality Above 1 GHz Using Double Ridged Horns

This is a summary of recent exploratory efforts conducted by the American National Standards Institute (ANSI) Accredited Standards Committee C63, Sub-Committee 1,working group 1-13.2 on site requirements for radiated measurements above 1GHz. The main

Interference in the 2.4 GHz ISM Band: Impact on the Bluetooth Access control Performance

Interference in the 2.4 GHz ISM Band: Impact on the Bluetooth Access control Performance

The emergence of Bluetooth devices operating in the same 2.4 GHz ISM frequency band as existing Wireless Local Area Network devices implementing the IEEE 802.11 standard specifications may lead to signal interference and result in significant performance

Information Technology Measurement and Testing Activities at NIST

Information Technology Measurement and Testing Activities at NIST

Our high technology society continues to rely more and more upon sophisticated measurements, technical standards, and associated testing activities. This was true for the industrial society of the 20th century and remains true for the information society

Electron Interactions with c-C 4 F 8

Electron Interactions with c-C 4 F 8

The limited electron collision cross-section and transport-coefficient data for the plasma processing gas perfluorocyclobutane (c-C 4F 8) are synthesized, assessed, and discussed. These include cross sections for total electron scattering, differential

Electron Attachment Cross Sections and Negative Ion States of SF6

Electron Attachment Cross Sections and Negative Ion States of SF6

A comprehensive and critical assessment of published data on the total, dissociative, and nondissociative electron attachment cross sections for SF 6 allowed us to recommend or suggest room temperature values for these cross sections over an energy range

A Comparison of Quantum-Mechanical Capacitance-Voltage Simulators

A Comparison of Quantum-Mechanical Capacitance-Voltage Simulators

We have systematically compared the results of an extensive ensemble of the most advanced available quantum-mechanical capacitance-voltage simulation and analysis packages for a range of metal-oxide-semiconductor device parameters. While all have similar

Comparison of the Identities, Fluxes, and Energies of Ions Formed in High Density Fluorocarbon Discharges

Comparison of the Identities, Fluxes, and Energies of Ions Formed in High Density Fluorocarbon Discharges

Positive ion bombardment plays an essential role in plasma processing, influencing etch rates, materials selectivity and etching profiles. Experimental determination of ion identities and energies in processing plasmas provides complementary data necessary

Book Section

Data Encryption Standard

Silicon Carbide Merged PiN Schottky Diode Switching Characteristics and Evaluation for Power Supply Applications

Silicon Carbide Merged PiN Schottky Diode Switching Characteristics and Evaluation for Power Supply Applications

A newly developed Silicon Carbide (SiC) Merged PiN Schottky (MPS) diode combines the best features of both Schottky and PiN diodes to obtain low on-state voltage drop, low leakage in the off-state, fast switching, and good high temperature characteristics

A Statistical Test Suite for Random and Pseudorandom Number Generators for Cryptographic Applications

A Statistical Test Suite for Random and Pseudorandom Number Generators for Cryptographic Applications

Random and pseudorandom numbers are needed for many cryptographic applications. For example, common cryptosystems employ keys that must be generated in a random fashion. Many cryptographic protocols also require random or pseudorandom inputs at various

ITL Bulletin

A Statistical Test Suite for Random and Pseudorandom Number Generators for Cryptographic Applications

Report on the Symmetric Key Block Cipher Modes of Operation Workshop

Report on the Symmetric Key Block Cipher Modes of Operation Workshop

A workshop was held to discuss the modes of operation for symmetric key block cipher algorithms on October 20, 2000 at the Baltimore Convention Center in Baltimore Maryland.

A Gamma-Based Framework for Modeling Variable-Rate MPEG Video Sources: The GOP GEAR Model

A Gamma-Based Framework for Modeling Variable-Rate MPEG Video Sources: The GOP GEAR Model

A flexible model called the GOP GBAR model based on Gamma-distributed variables is proposed for variable-rate MPEG video sources. This model is an extension of Heyman's GBAR model for video teleconferencing. The GOP GBAR model takes explicit account of